| I would like to know if someone aleady have problems with Ceramic Capacitors SMD in In-Circuit Test (see below)and how did you solve this problems ? | | PROBLEMS | 1 - Only one kind of capacitor (2n2F), of all capacitors on board, sometimes are open, and if you change its, using the same capacitor from new reel, the In-circuit test approvel this board. | 2 - During somewhere of shift one kind of capacitor (2n2F) of all capacitors on board are open.
| | Our parameter of process are: | | Cure of GLUE (side B) with 160�C at 120 sec. | Soldering of Components by Machine (side B + PHT) with Pre Heater 153�C, solder bath 245�C and Dip Time less 5 sec | | Thank you very much | | Adriano Fernandes
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Hi Adriano,
Couple of things I would consider are as follows:
1) Date code of that particular type cap and SPQL in incoming for that particular vendor/type comp.
2)Do u do process characterization for every new comp on your product during feasibility/proto/pre-prod. runs? If yes. then it would narrow down your Root cause analysis regarding date code specific problem for both process(for your end)/comp.vendor.
3) Run a DOE with same process with all NEW process implementation into account.
4)Testing (ICT) parameters can be reviewed.
5) Need special attention/review on all temp./heat cycle spec for that particular comp.
6)SMP footprint and comp leads/contact geometry.
Hope it helps
Regards Kc.
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