Hi,
Whenever I'm measuring IMC using the optical microscope, I have to make sure that the images captured are clear. If not, then i will have an issue in differentiating the blurry areas between the IMC and solder(for example).
This gives variation in the measured thickness and area of the IMC. Of course, if I use SEM I will get a clearer picture, but then i will be focusing on a smaller area.
I am looking at new ways to measure intermetallics or to verify the accuracy of the existing method. When you do conversion from the real physical area to pixels, there will always be some deviation from the actual. Of course the current method (using optical microscope and SEM) has been refine and I don't think the deviation is large.
Anyway, thanks for the comment.
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