Digital I/O Scan (DIOS) and Socket Test Modules (STM)

Digital I/O Scan (DIOS) and Socket Test Modules (STM) Description:

The boundary-scan I/O modules provide an effective means of increasing test coverage on the target board and improving the diagnostic resolution of boundary-scan testing. The modules are grouped into two general classifications: general purpose digital I/O scan (DIOS) modules and socket test modules (STM). All of the DIOS and STM modules are fully supported by JTAG ProVision, the unified graphical development tool for preparation of boundary-scan test and programming applications, as well as by the earlier Classic development tools. Both ProVision and Classic automatically integrate the I/O modules with the target board design.

Four types of DIOS modules are available, JT 2111/MPV (DIN and IDC), JT 2122/MPV, JT 2124, and JT 2128. The JT 2111/MPV is designed for desk-top use and provides 64 channels of I/O. The other three DIOS types are packaged in DIMM modules and provide either 128 or 133 digital I/Os, accessible via boundary-scan over a range of power supply and I/O voltages. The JT 2128 DIOS modules add programmable functionality to facilitate combining boundary-scan testing with functional testing.

The JT 2127 STM is currently available with five standard DIMM connector pinouts: 184, 144so (small-outline), 200so (DDR I type), 200so2 (DDR II type), and 244so2. The STM includes the capability to measure the power pins and ground pins individually and to verify their voltages to be within a certain range. Therefore, it is ideal for testing DIMM connector sockets on target boards.