Fischerscope X-ray Measurement Systems

Fischerscope X-ray Measurement Systems Description:

The Energy Dispersive X-Ray Fluorescence Analysis (ED-XRFA) is a method for measuring the thickness of coatings and for analyzing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilized with modern equipment.

Applications
Because ED-XRFA is capable of determining the composition of materials and measuring thin coatings and coating systems, there is a wide variety of applications for this technology. Examples include:

• In the electronics and semiconductor industries, thin gold, palladium and nickel coatings are ascertained on contacts or on traces.
• In the watch and jewelry industries or in precious metal refining, accurate knowledge of the composition
• For quality and incoming goods inspections, exact compliance with material specifications is essential.
• In the photovoltaic industry, for example, the composition and thickness of a photovoltaic film determines its efficiency, while in contract electroplating, it is necessary to measure the coatings of mass-produced parts.
• For manufacturers and importers of electronic goods, it is critical to be able to monitor compliance with the Restriction of Hazardous Substances (RoHS) Directive.
• The toy industry is also dependent on the reliable detection of harmful substances.

FISCHERSCOPE X-RAY measurement systems are optimally suited for all these purposes.