Signatone Prober/Probe Station w/CPU XXC5S/LDC1

Signatone Prober/Probe Station w/CPU XXC5S/LDC1 Description:

Includes: 100mm Chuck, Signatone XXC5S/LDC1 Probe Station #XXC5S-NOV, Signatone S-400 Controller, Signatone SA-Zoom, Signatone X/Y Axis Controller XXC5T-NOV, Signatone S-96MW Micropositioner, Kinetic System Vibraplane Table, Ready Lamp ELC-15 Light Source, Turk 4 Port Video Switch
Product Description
The wafer probe workstation was pulled from a working environment. Pending evaluation. Kindly contact us if you have any questions regarding this item.

Probing station description:

100mm Chuck
Signatone XXC5S/LDC1 Probe Station #XXC5S-NOV
Signatone S-400 Controller
Signatone SA-Zoom
Signatone X/Y Axis Controller XXC5T-NOV
Signatone S-96MW Micropositioner
Kinetic System Vibraplane Table
Ready Lamp ELC-15 Light Source
Turk 4 Port Video Switch
Manufacturer Description
Signatone is pleased to introduce the new XXC semiautomatic probe station designed for use with a Local Chamber (LCD2-XXC). The XXC probe station runs under control of the popular Signatone Solutions Windows software allowing step and repeat or sub-micron resolution movements. The wafer chuck diameter and the wafer stage range of motion is 200mm (8"). Several microscope options are avaialble. The XXC accepts most micropositioners, hot chucks, cold chucks, microwave probes, and other options.

When integrated with the local chamber, a number of benefits are gained. The chamber acts as a light tight shield preventing light into the test area allowing C-V, femto amp level current tests and other light sensitive measurements. The chamber also acts as a shield against RF noise. When probing at temperatures below the dew point, the chamber creates a small environmental chamber allowing a dryer to quickly evacuate moisture and permit probing down to -65° C without frost build up. One of the key benefits includes manual access to position the probes and microscope.

The tasks involved in analyzing a semiconductor device failure include finding the correct lines or nodes to probe, placing probe tips on probing targets, and often, re-locating and re-probing targets on the same unit or another unit. The use of a programmable, intra-device navigation system greatly reduces the time and effort required to perform these tasks and provides greater protection for the device under test.