cViper Probe Head
Company Information:
Name: |
cViper Probe Head |
Category: |
|
Offered by: |
|
cViper Probe Head Description:
Benefits
• Allows testing of RF devices at the wafer-level
• Adaptable to wafer-level probing and singulated device testing for debug and characterization
• Long life and extended maintenance intervals
• Engineering analysis of WLCSP devices or KGD
• Consistently high test yields
• Maximum mechanical operating window to overcome z-stack non-coplanarity
Key Features
• Low loop inductance and high bandwidth
• Device pitches down to 100 µm
• Variety of contact and body materials to optimize performance
• Manual actuation of singulated devices • Low and stable contact resistance
• Individual probe compliance with large mechanical overdrive
cViper Probe Head was added in Jul 2021
cViper Probe Head has been viewed 63 times
15 More Products from Shenzhen PTI Technology CO.,LTD :