Using JTAG Emulation for Board-Level Functional Test Demanding Test
Published: |
September 2, 2010 |
Author: |
ScanExpress JET™ White Paper |
Abstract: |
As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi... |
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