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Tin Whiskering on PCBA Capacitors in Storage (Inside ESD Bag, Inside a Sealed Cardboard Box)

Published:

January 13, 2011

Author:

Terry Munson

Abstract:

The tin whisker failures investigated in this paper were found on functional RoHS-compliant hardware. The samples were not conformal coated. This paper will document the conditions associated with the whisker formation under the following conditions; tin ...

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Foresite is a process consulting house and analytial laboratory dedicated to solving product reliability challenges for electronics manufacturers.

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