Proof is in the PTH - Assuring Via Reliability from Chip Carriers to Thick Printed Wiring Boards
Published: |
June 6, 2007 |
Author: |
Kevin T. Knadle, Virendra R. Jadhav. |
Abstract: |
Though today's microvias and high aspect plated through holes (PTH's) look nothing like the earliest through holes of 40 years ago, the PTH in its various forms remains the “weak link” and most critical element of printed wiring boards and laminate chip carriers (...) The paper outlines an approach to evaluating PTH reliability and quality that involves characterizing PTH life across a range of temperatures to reveal intricacies not seen by testing at a single delta-T, and certainly difficult to predict by modeling alone.... |
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