Testing Digital Designs – The Boundary-scan Balance
Published: |
May 20, 2010 |
Author: |
James Stanbridge, Steve Lees |
Abstract: |
As several industry pundits have expressed in recent years: "the era of 'one test method fits all' seems well behind us." For most test managers with even a modest mix of products, trying to formulate a test policy/philosophy has become a tricky balancing act at the best of times. James Stanbridge, Sales Manager UK for JTAG Technologies, and Steve Lees Managing Director of ATE Solutions look at the options.... |
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