The Long-term Shaping of the JTAG/Boundary-scan Standards
Published: |
May 11, 2015 |
Author: |
Peter van den Eijnden, MD JTAG Technologies. |
Abstract: |
Originating from the last millenium, almost three decades ago, the introduction of surface mount packaging triggered a wave of changes throughout many aspects of electronics production. A small number of talented, innovative test engineers from various big players of the industry started to attend meetings to discuss the impact of that change of technology on their future test concepts for modern assemblies. The Joint Test Action Group was born.... |
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