Feb 16, 2012 
Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its proprietary DuraPad™ surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors.
Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. DuraPad™ brings substantial cost of test savings to high-volume production sites of array packages and WLSCPs.
Multitest has performed extensive pad wear analyses to understand the actual issues with established surface coatings and to be able to provide the DuraPad™ solution. The company’s unique product portfolio of handlers, contactors and boards enabled the engineers to apply Multitest’s comprehensive knowledge of the mechanical interactions. The results were presented at BiTS 2010 and 2011. The papers are available for download at www.multitest.com/padwear.
For more information about test interface boards, visit www.multitest.com/pcb.
Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. Globally, more than 700 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.
