Aug 22, 2013 
Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that due to mobility and the related demand for connectivity, the data volume in cloud servers is significantly growing. CPUs are increasing in performance, but at the same time the cost pressure grows.
The well-established MT9510 XP pick-and-place handler now offers a handling solution for such ICs that doubles the throughput.
Usually this type of functionality comes with large packages and high pin count ICs, such as 1000+ balls on BGAs. The MT9510 XP offers a special “Jumbo” configuration for this. Now this configuration is able to support dual site test for the full ambient-hot-cold temperature range. With this high pin count, the plunger force often is an issue. The MT9510 XP provides up to 620 N per contact site in the standard dual Jumbo (x2) configuration. More is available on request.
The dual Jumbo configuration of the MT9510 XP significantly and reliably increases test efficiency. The dual Jumbo configuration recently was released into production at a major OSAT. For more information, visit www.multitest.com.
Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer and communication but also to the sensor market. Globally, more than 900 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.
www.multitest.com
