Ikon Test Solutions Ltd

 About Us

Ikon Test Solutions is an independent test house specialising in in-circuit test services. Our goal is to provide ATE solutions of a high standard and quality at a competitive cost. This could be a full turnkey solution or solution/support tailored to the specific needs of customer. Customer satisfaction is one of the main drives for our company. We have over 18 years of experience in ICT test development for Aerospace, Automotive, Medical, Telecommunications, Defence, Consumer and Computer Industries. Solutions developed for customers by engineering staff in the past include IBM, Nortel, Sun Microsystems, Thales, NCR, Solectron, Cognex, IPwireless, Airspan, Flextronics, Pace, Optus, Alcatel, Merloni, Schneider, Teradyne, Visteon and Wavecom.

Products and Services

 Offering Full Range Of ICT Test Products And Services :

A full range of products and services are available to meet your needs.

Test Consultancy

Contract Engineering

Full Design For Test (DFT) Analysis

Turnkey Teradyne Teststation (GenRad 228x) Solutions

Turnkey Teradyne 18XX Solutions

Turnkey Agilent 3070 Series Solutions

Turnkey Or Machine Ready Flying Probe Takaya Solutions

Batch Testing Of Boards

Training Tailored To The Needs Of Customer 

Analysis Of Existing ICT Solutions With View Of Fixture/Program Enhancements 

Bespoke Functional Test Solutions

Programming Services

We have extensive experience of test development and production support to draw upon. This allows us to provide maximum test coverage on a robust production friendly fixture for your boards.  The test program will also be developed and supplemented with Ikon Test Solutions software tools and custom test libraries to provide the highest consistency, performance, throughput, and quality.

Test Strategy Development

Design-For-Testability (DFT) reviews

CAD Review & CAD Data Processing 

Test Program Development - Simple to Complex

Test Program Quality

Test Program and Fixture Documentation 

• Automated LED Color and Intensity Detection

  Vectorless - Opens Xpress // Testjet

  Custom Device Test Model Development - Analog, Digital and Hybrid

  Boundary Scan Testing

  Cluster testing

  In System Programming - FLASH, EEPROM, CPLD, PIC, (Serial Number encoding)

  Functional Testing

   Fault Coverage, Stability, Reporting (Device / Pin Level)

  Gauge Repeatability and Reproducibility. (On Request. Requires 10 gold sample cards for analysis)

Support

We will support our solutions and are also happy to support you with any problems on existing test solutions provided by third parties. 

On-Site Program Installation 

On-Site Program Support and Enhancement Including ECO’s

Remote Site Support

ICT Test Fixtures

We have working relationship with many fixture suppliers which allows us to choose supplier that best fits your needs. If you have any preference for fixture supplier we will use supplier of your choice.

Test Fixture Design

Pneumatic, Vacuum, Wireless, Dual Stage, Top Side, Side Access probing 

Automated Switch Activation

Automated connector presence/polarity check

Direct Connector probing

Board Scribing

Flying Probe Test Services

Flying probe test means that no fixture is required. The Takaya tester does not require test points and can gain test access by probing on edge of SMD pads on populated board. This means that it can be used for early prototype cards with no test points available. We can supply full turnkey solution or supply generated program only. If you have batch of cards that have no in-circuit test we can offer facility to test these boards.

CAD Review & CAD Data Processing

Program Generation Only

Program Generation and Debug

Batch Testing Of Boards