Acculogic iTH 7000 In-Line Test Handler

Acculogic iTH 7000 In-Line Test Handler Description:

Acculogic’s Inline Scorpion is a fully automated in-circuit test system for high volume production with the added advantage of a very fast change over time for many different assemblies, including fixture change.

The iTH 7000 is ideally suited for the modern flexible manufacturing line that requires a fast transition between products. Upper and lower fixtures are a single unified fixture with coding for proper conveyor width and automatic call up of the test program.

One powerful tester. High Fault Coverage. Easy to use.

• Comprehensive and accurate MDA measurement and Guarding
• Advanced automatic program generation software
• Expandable to 1,680 pins
• Complete fixture change in less than one minute
• Maximum board size 400 mm x 400 mm
• Single or double sided testing single fixture
• Cycle time of 5 seconds plus test time
• Functional power-up testing
• BodeScan Network Analysis
• Vectorless Test capability
• Boundary Scan
• Flash Programming
• Utilize your existing fixtures
• Low cost
• Full software compatibility to the Scorpion Flying Probe Tester
• Small Footprint: 760mm L x 900mm W x 1800mm H
• SMEMA compliant conveyor

The Testing Power You Want

Acculogic’s Scorpion family of Automated Test Equipment (ATE) and In-circuit fixture-based testers were created with one underlining theme in mind: Cost-effective Testing. To achieve this objective, we designed a range of feature-rich testers offering:

• Advanced automatic program generation software
• Automatic CAD translation tools
• High performance analog measurement system – comprehensive passive component and discrete analog device test
• Patented vectorless opens test
• Unique and convenient Fixture exchange system
• Customizable Fixture Receiver to protect your fixture investments

Our systems can be configured with the following options in order to help you gain the maximum return on your investment, and to streamline your manufacturing processes:

• BodeScan
• Power-up Test
• Advanced Function Test
• Boundary Scan (JTAG) Test
• In-System and Device Programming