MTS 300 Sigma - In-Circuit Test Solution
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MTS 300 Sigma - In-Circuit Test Solution Description:
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability.
Highest Throughput and Highest Quality Test
- Non-Multiplexed to 3,456 pins
- Fast Test Program Generation
- Safe Back-Driving
- 10V and Low Voltage Driver/Sensor Options
- Links to CAD through C-LINK
- Importing data from over 60 design formats
- Configurable BOM Reader
- Comprehensive Component Database
- Vast test module library
- Automatic test program generator
The MTS300 Sigma from Digitaltest is designed to meet the demands of today’s test systems: flexibility, high fault coverage and ease of programming.
The flexibility of the test system is guaranteed by the modular design and the variety of test methods it offers.
Also, due to its modular design, the MTS300 Sigma can be optimally configured for current test requirements without limiting the possiblities for future expansion.
Subsequent changes of individual test methods, as well as the number of test pins (3.456) can be easily implemented within the MTS300 Sigma.
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market.
Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
The MTS300 can be easily integrated into a handling system.
The handling system offers enough space for the MTS300 test system rack plus additional space for IEEE or VXI/PXI instruments.
Short wire connections guarantee signal integrity and quality.
The non-multiplexed pin architecture provides the opportunity to adapt to existing fixtures and test programs currently used with other test systems and enable testing on the MTS300.
The MTS Test System Family
- Sparrow MTS30 - Bench Top Tester
- Eagle MTS180 - Press Down Tester
- Sigma MTS300 - Vacuum Tester
- Condor MTS500 - Flying Probe Tester
- Omega MTS888 - High Performance Tester
- Lambda - Concurrent Tester
- Falcon - In-Line Tester
Common features:
- Complete ICT & FCT Capability
- Boundary Scan
- Memory Programming and Flash
- Dynamic High Speed
MTS 300 Sigma - In-Circuit Test Solution was added in Mar 2011
MTS 300 Sigma - In-Circuit Test Solution has been viewed 1248 times
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