Lorlin Test Systems
Lorlin manufactures discrete semiconductor component test systems for small signal and power devices. 50 years in business, over 3000 installations. SMD devices: transistors, Fets, diodes, scrs, triacs, optos, and many others.
Lorlin Test Systems©
Discrete Semiconductor Component Test Systems
50 Years in Business - Over 3000 Customers
Test, Sort, Screen, Grade, Classify, Evaluate, Measure, Analyze, Characterize Small Signal and Power Semiconductors
The Lorlin© product line is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test systems can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
Customers can test components in bulk or large quantities of unknown part numbers and sort them by the most expensive highest rated or desired parts of the day by using our special sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers.
Counterfeit Device Detection
System Rental Programs
Rent a Lorlin tester at a low monthly price
100% Direct Lorlin Financing with 0% Interest
Rent to Own Option with 50 % of Payments Applied to the Purchase Price
1-2 Year Rental Agreements, Renewable Annually Thereafter
Configurations from 600 to 2000 Volts, 20 to 500 Amps and One to Five Test Stations
Manual or Automatic Handler/Prober Applications
Small Signal and Power Semiconductor Testing Applications
Systems include Warranty, Latest Lorlin PC Software, and Customer Support
This Rental Program applies to Rebuilt Lorlin 7BT and Double Impact Systems
Contact Lorlin Test Systems Today!
508-879-1827
sales@lorlin.com
Lorlin manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. Our device library covers 1000's of the most common devices and can easily be edited for similar parts. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
