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Technical Articles From Oracle Corporation

Read technical articles about electronics manufacturing added by Oracle Corporation


1 technical article added by Oracle Corporation

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(1) technical library article

High Frequency Dk and Df Test Methods Comparison High Density Packaging User Group (HDP) Project

Feb 06, 2019 | Karl Sauter

The High Density Packaging (HDP) user group has completed a project to evaluate the majority of viable Dk (Dielectric Constant)/Df (Dissipation Factor) and delay/loss electrical test methods, with a focus on the methods used for speeds above 2 GHz. A comparison of test methods from 1 to 2 GHz through to higher test frequencies was desired, testing a variety of laminate materials (standard volume production with UL approval, low loss, and "halogen-free" laminate materials). Variations in the test board material resin content/construction and copper foil surface roughness/type were minimized. Problems with Dk/Df and loss test methods and discrepancies in results are identified, as well as possible correlations or relationships among these higher speed test methods....

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