News Releases from Multitest Elektronische Systeme GmbH
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- News Releases from Multitest Elektronische Systeme GmbH
135 news releases added by Multitest Elektronische Systeme GmbH
Company Information:
Multitest’s Marcus Frey to Discuss Contact Force Change at BiTS 2011
Jan 31, 2011 | Multitest announces that Marcus Frey, Material Engineer, will present the paper "Contact Force Change as a Measure for Current Carrying Capability" at the upcoming Burn-in & Test Socket Workshop (BiTS), scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Multitest Develops Innovative LCR Concept for Cost Efficient, High-Performance Test Interface Boards
Nov 24, 2010 | Multitest's board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.
Multitest’s DURA® Kelvin Recognized with a 2010 Global Technology Award
Oct 27, 2010 | Multitest announces that it has been awarded a Global Technology Award in the category of Components for its DURA® Kelvin™.
Multitest Offers Test Interface Simulation for Optimized, Cost-Efficient Test Interfaces
Oct 14, 2010 | Multitest now offers Test Interface Simulation to optimize test interfaces. Signal Integrity Simulation is valuable in understanding the performance of the test interface.
Multitest Releases Plug & Yield™ Solution
Oct 06, 2010 | Multitest announces that its new Plug & Yield™ provides significant cost and time savings by enabling users to bring products to market faster and at the lowest possible cost.
Wafer-Scale Contactors Using Multitest Mercury Probes Successfully Deployed to Subcontractors in Asia
Sep 22, 2010 | Multitest announces that one of the world’s largest fab-less semiconductor manufacturers has evaluated Mercury-based wafer-scale contactors and found them superior to its previous traditional, POGO-style spring pin solution.
Multitest’s MT9510 Reaches Record-Breaking Order Numbers
Sep 14, 2010 | Multitest announces record-breaking annual order numbers for its MT9510 tri-temp pick-and-place handler. The demand is driven primarily by automotive customers worldwide.
Committed to Quality, Standards and Ethics: Multitest Renews ISO 9001/14001 Certification
Sep 07, 2010 | Multitest announces that it has successfully passed the annual audit for its ISO 9001 quality management and ISO 14001 environmental certifications for the 10th consecutive year.
Multitest’s Gemini™ Contactor Chosen as Standard by Major Semiconductor IDM
Aug 27, 2010 | Multitest announces that its Gemini™ series contactors have been chosen by another major semiconductor IDM as the contactor of choice for QFN packages. Gemini™ outperformed the competition in multiple categories over months of evaluation.
Multitest Cooperates With Semi Taiwan MEMS Committee to Support Asian MEMS Industry
Aug 18, 2010 | Multitest, the market leader for MEMS test and calibration equipment, sees great opportunities for the MEMS industry in Asia. Alex Chen, Taiwanese Regional Manager, recently became a member of the Semi Taiwan MEMS Committee to actively contribute to the success of the Asian MEMS industry.
Multitest’s Günther Jeserer Chairs Successful Workgroup at SEMICON West 2010
Aug 09, 2010 | Multitest’s Business Unit Manager Günther Jeserer held a successful Docking and Mounting Interface Workgroup meeting at the recent SEMICON West exhibition on Wednesday, July 14, 2010.
Multitest Introduces Contactors for ICs with Differential Signals: Best Configurations Derived from 3-D Electromagnetic Simulation
Jul 22, 2010 | Multitest announces that it has designed differential contactors that are customized for each semiconductor test application. The selection of the contactor materials and probes are optimized for the desired impedance.
Multitest Introduces Superior Spare Support: S3 Program for the Most Effective Spare Parts Administration and Logistics
Jul 06, 2010 | Multitest has expanded the portfolio of its Singapore spare parts distribution center for pogo pin-based contactors. With this step, all major spare parts for test handlers and contactors now are available for fast delivery to Asian test sites.
Multitest Named One of “THE BEST Chip Making Equipment Suppliers for 2010” by VLSIresearch Inc.
Jun 30, 2010 | Multitest announces that it has once again been named one of the top ten chip making equipment suppliers in the annual Customer Satisfaction Survey conducted by VLSIresearch. The annual survey is conducted globally and provides industry-wide feedback on overall company performance.
Multitest’s Günther Jeserer to Hold CAST Workgroup Meeting at SEMICON West 2010
Jun 28, 2010 | Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will hold a Docking and Mounting Interface Workgroup meeting at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.
Multitest’s Bernhard Lorenz to Present at SEMICON West 2010
Jun 23, 2010 | Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Bernhard Lorenz, Director of Engineering, will present a paper titled “Test in Carriers - The New Test Solution” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.
Multitest's Günther Jeserer to Present at SEMICON West 2010
Jun 23, 2010 | Rosenheim, Germany — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will present a paper titled “Improved Cost of Test by Optimized Tester Utilization” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.
Multitest Introduces MEMS Solution for Pressure Sensors
Jun 11, 2010 | Rosenheim, Germany - Mulitest's concept for MEMS test and calibration equipment continues for pressure sensors. Common applications include all types of pressure monitoring, e.g. altitude meters, tire pressure control, differential pressure sensors, and various medical and industrial devices.
Multitest Launches Multi-site Testing for High Pin Count Devices: MT9510 Pressure Booster
May 26, 2010 | Rosenheim, Germany - For high pin count devices, the capability of multisite testing generally is limited by the required contacting force. Additionally, there are even complex, integrated ICs with an extremely high pin count for which even single site testing is critical because of too little contact force. The well-established tri-temp pick-and-place handler, MT9510XP, now offers an option to substantially increase the contact force. This new feature enables users to test even high pin count devices in up to eight contact sites in parallel.
Multitest’s MT9928 Platform Provides the Best ROI Combined with the Highest Efficiency
May 20, 2010 | Rosenheim - Multitest announces that its next-generation MT9928 bowl feed module has successfully passed the strict QA and production approval requirements of an international IDM. The state-of-the-art gravity feed handler offers a variety of loading and un-loading options. With a throughput of up to 14,500 uph, the bowl feed loading module is the loading option of choice for small package sizes.
Increasing Popularity of MEMS Sensors – Multitest Meets New Requirements in Performance and Cost
May 11, 2010 | Rosenheim, - Multitest announces that SensorDynamics, a semi-fabless semiconductor company, is using Multitest equipment for MEMS test and calibration for the entire temperature range. SensorDynamics recently introduced its new 2- and 3-D gyroscope MEMS sensors for a range of applications, from automotive to medicine and high-end consumers.
Streamlined Spares Support ― Multitest Introduces e.services to Optimize Spare Parts Processing.
Apr 30, 2010 | Rosenheim, Germany - Multitest introduces e.services, the new online tool created to significantly save costs and time in spare parts processing. The easy-to-use online service allows users to minimize efforts for spare parts in both the operation and purchasing departments. Additionally, the online tool makes all related information readily available and easy to find.
1000th Gemini™ Kelvin Contactor Shipped – A Three Year Success Story
Apr 20, 2010 | St.Paul, Minnesota - Multitest’s ECT Interface Products group announces the shipment of its 1000th Gemini™ Kelvin contactor. The customer base for this product consists of satisfied customers around the world. All Gemini™ Kelvin customers have been repeat customers. In just three years, these contactors have become extremely successful because they provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-scale devices.
Multitest Introduces Enhanced MT9928 Applications - Temperature Calibration with 0.2°C Stability
Feb 18, 2010 | Rosenheim, February 2010: Multitest, a leader in temperature test, has developed a dedicated set up for the MT9928 gravity handler to allow for calibrating temperature sensors.
Multitest’s Tony DeRosa to Present at BiTS 2010
Feb 17, 2010 | Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Tony DeRosa, product manager, will present a paper titled “New Probe Architecture Performance in High-Volume Production” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Multitest’s Valts Treibergs and Chris Cuda to Present at BiTS 2010
Feb 15, 2010 | Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Valts Treibergs and Chris Cuda will present a paper titled “Spring Probe PCB Pad Wear Analysis” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Multitest’s Ryan Satrom to Present at BiTS 2010
Feb 12, 2010 | Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom and Valts Treibergs will present a paper titled “An Improved Characterization Technique for Contactors” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/ Mesa Hotel in Mesa, Ariz. The presentation will be held during Session 4, which will take place Tuesday March 9, 2010 at 10:30 a.m.
Multitest to Showcase Leading Contactors at BiTS 2010
Feb 11, 2010 | Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will showcase its leading contactors at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Multitest’s InCarrier™ Provides Reliability and Best Cost of Test
Feb 08, 2010 | Rosenheim, February 2010: Multitest received the first multi-system order for the new InCarrier™ handler by a European IDM. The systems will be used for high-parallel test of small MEMS sensors.
Multitest to Exhibit Latest Technologies at SEMICON Taiwan
Aug 19, 2009 | Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it will feature the MT2168 system, test socket solutions, and ATE board design services in booth 2602 at the upcoming SEMICON Taiwan exhibition, scheduled to take place September 30-October 2, 2009 at the Taipei World Trade Center in Taipei, Taiwan.
Multitest Renews ProWorks Licenses
Aug 12, 2009 | POMONA, CA — August 2009 — Multitest, a manufacturer of semiconductor handling equipment, has renewed its licenses for ProWorks for another year. ProWorks has helped Multitest obtain agility and flexibility in these economic times by giving it the ability to quickly adjust its workforce to the environment.
Multitest Appoints Steve Dielman As Regional Manager
Aug 07, 2009 | Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, is pleased to announce that Steve Dielman is the new Regional Manager for Multitest’s US handler business.
ECT Interface Products Awarded With Plaque of Appreciation
Aug 06, 2009 | Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the Multitest business unit “ECT Interface Products” received the “Plaque of Appreciation” from Cypress.
Multitest Introduces Automatic Contactor Cleaning Feature for the MT9510
Aug 04, 2009 | Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, introduces the new Automatic Contactor Cleaning (ACC) feature for the MT9510, capable of cleaning the contactor fast and without manual interruption of the handling process.
Multitest's MT2168 Experiences Growing Installed Base
Apr 08, 2009 | Rosenheim, Germany, April 2009: Multitest has shipped the first MT2168 pick-and-place test handling system to the USA. With this shipment, the MT2168 now covers Asia, Europe and the USA. The fast acceptance of this new system is based on the leading solution itself, but also is strongly substantiated by the absolutely favourable and competitive price structure and Multitest's global support.
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