News Releases from NANOVEA
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3 news releases added by NANOVEA
Company Information:
Nanovea Unveils Its New Revolutionary N3 Line
Jan 20, 2012 | Nanovea today announced the arrival of the N3 line dedicated to providing high-end measurement technology to the broader market. Nanovea has fully automated their measurement techniques while designing to price in the $20K market.
Breakthrough Indentation Yield Strength Test
Jul 26, 2011 | Nanovea introduced its patent pending breakthrough method of reliably acquiring yield strength through indentation; ultimately replacing the traditional tensile testing machine for yield strength measurement.
CONSIDER MACHINE VISION FOR SURFACE MEASUREMENT OBSOLETE
Jun 14, 2011 | The white light axial chromatism technique utilized by Nanovea’s 3D Non Contact Profilometers has become widely known as a vital bench top research and verification tool. It is now the Automated Optical Inspection (AOI) environments that have begun to acknowledge Nanovea’s superior capability. Unlike the traditional vision and laser systems that typically sacrifice one feature for another, speed or resolution, Nanovea provides both. Vision and laser systems also have very limited automated surface measurement options, where as Nanovea’s system provides a wide range including: Profile, Dimension, Roughness, Shape & Form, Flatness & Planarity, Volume Area, Step-Height Depth and Thickness. And keep in mind, the technique utilized by Nanovea’s inspection system has the superior ability to measure nearly any material surface and zero influence from sample reflectivity or absorption.
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