Multitest’s Valts Treibergs and Chris Cuda to Present at BiTS 2010

Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Valts Treibergs and Chris Cuda will present a paper titled “Spring Probe PCB Pad Wear Analysis” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz. The presentation will be held during Session 2, which will take place Monday, March 8, 2010 at 3:30 p.m.

During the product lifecycle of a semiconductor device, an ATE performance board may be used for millions and millions of individual DUT insertions. The life expectancy of the performance board is at least an order of magnitude greater than the individual set of socket interconnects (Pogo pins/spring probes in this case). Most investigations on interconnect reliability center on the probe-DUT interface. This study focuses on the probe to PCB interface.

Since reliability testing over millions of insertions can be a very time intensive endeavor, a standardized method needed to be developed to observe wear in an accelerated manner. The test method needed to mimic an actual ATE environment as much as possible. A test system has been developed to wear PCB pads to 2 million cycles in under two weeks time. The test system setup and test methodology will be described in this presentation.

A variety of spring probe geometries has been tested using the above methodology against standard ATE performance board pad configurations. Results will be shown for various spring probe geometries, including conical, spherical, crown, flat and flat-probe technologies.

Socket cross-section is an important aspect for long-life PCB pads. A discussion and data will be presented that address socket preload and spring probe chatter on the longevity of PCB pads.

The last critical element in optimizing PCB pad life is the surface finish of the pads itself. Two popular surface finishes for pads have been studied and the results of wear testing will be discussed,.

About Multitest

Multitest Elektronische Systeme GmbH, Rosenheim is one of the world’s leading manufacturers of test equipment for semiconductor. Under the brands Multitest, ECT Interface Products and Harbor Electronics Multitest market test handlers, contactors and ATE printed circuits boards. It has offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand. Multitest has an annual turnover of greater than 100 million EURO and currently employs more than 750 people.