Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability
Published: |
June 2, 2011 |
Author: |
Edward Wyrwas, Lloyd Condra, Avshalom Hava |
Abstract: |
Modern electronics typically consist of microprocessors and other complex integrated circuits (ICs) such as FPGAs, ADCs, and memory. They are susceptible to electrical, mechanical and thermal modes of failure like other components on a printed circuit boa... |
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