Electrostatic Theory of Metal Whiskers.

Published:

July 31, 2014

Author:

V. G. Karpov, Department of Physics and Astronomy, University of Toledo.

Abstract:

Metal whiskers often grow across leads of electric equipment and electronic package causing current leakage or short circuits and raising significant reliability issues. The nature of metal whiskers remains a mystery after several decades of research. Here, the existence of metal whiskers is attributed to the energy gain due to electrostatic polarization of metal filaments in the electric field. The field is induced by surface imperfections: contaminations, oxide states, grain boundaries, etc. A proposed theory provides closed form expressions and quantitative estimates for the whisker nucleation and growth rates, explains the range of whisker parameters and effects of external biasing, and predicts statistical distribution of their lengths....

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The UT is one of the 14 state universities in Ohio offering over 250 academic programs in a diverse and comprehensive range of studies

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