Application Of Build-in Self Test In Functional Test Of DSL
Published: |
May 23, 2012 |
Author: |
YaJun Gu, Ye Qin, ZhiJun Wang, David Wei, Andrew Ho, Stephen Chen, Zhen (Jane) Feng Ph. D., Murad Kurwa |
Abstract: |
first published in the 2012 IPC APEX EXPO technical conference proceedings. BIST (build-in self test ) is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing, i.e., testing of... |
|
|
|
|
|
|
You must be a Company Information:
More articles from Flex (Flextronics International) »
- Jan 23, 2019 - AOI Capabilities Study with 03015 Component
- Jun 15, 2017 - Nondestructive Inspection of Underfill Layers Stacked up in Ceramics-Organics-Ceramics Packages with Scanning Acoustic Tomography (SAT)
- Oct 27, 2016 - Press Fit Technology Roadmap and Control Parameters for a High Performance Process
- Sep 01, 2016 - Reliability Study of Low Silver Alloy Solder Pastes
- Aug 18, 2016 - Selective Reflow Rework Process
- See all SMT / PCB technical articles from Flex (Flextronics International) »
More SMT / PCB assembly technical articles »
- Apr 11, 2022 - iNEMI Webinar 07.07.2021 - PCB Cleaning | ZESTRON Americas
- Jan 28, 2022 - Open Radio Unit White Box 5G | Whizz Systems
- Nov 10, 2021 - Understanding the Cleaning Process for Automatic Stencil Printers | ITW EAE
- Oct 20, 2021 - PCB Surface Finishes & The Cleaning Process - A Compatibility Study | ZESTRON Americas
- Oct 06, 2021 - Cleaning Before Conformal Coating | ZESTRON Americas
- Browse Technical Library »
Application Of Build-in Self Test In Functional Test Of DSL article has been viewed 449 times
